Document Actions
AEBCOL7
COL7
TESTING UNIT FOR AEB TIMING ADVANCE PROCESSORS
Timing advance processors testing unit
Package contents
- testing unit
- coil unit for testing high voltage advance processors.
- Set of test cables
- instructions and relative test procedures
Download
Technical specifications
- Universal tester for testing the three main types of Timing advance processors: Timing advance processors for high voltage signals, Timing advance processors for low voltage signals and Timing advance processors for inductive and Hall effect CKP sensors.
- The tester must be combined with an oscilloscope in order to verify the details of the signals generated by the product being tested.